Resistive Switching Behavior seen from the Energy Point of View

Jorge Gomez, Angel Abusleme, Ioannis Vourkas, Antonio Rubio

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

2 Citas (Scopus)

Resumen

The technology of Resistive Switching (RS) devices (memristors) is continuously maturing on its way towards viable commercial establishment. So far, the change of resistance has been identified as a function of the applied pulse characteristics, such as amplitude and duration. However, parameter variability holds back any universal approach based on these two magnitudes, making also difficult even the qualitative comparison between different RS material compounds. On the contrary, there is a relevant magnitude which is much less affected by device variability; the energy. In this direction, we doubt anyone so far has ever wondered 'what is the quantitative effect of the injected energy on the device state?' Interestingly, a first step was made recently towards the definition of performance parameters for this emerging device technology, using as fundamental parameter the energy. In this work, we further elaborate on such ideas, proving experimentally that the 'resistance change per energy unit' (dR/dE) can be considered a significant magnitude in analog operation of bipolar memristors, being a key performance parameter worth of timely disclosure.

Idioma originalInglés
Título de la publicación alojada2018 IEEE 24th International Symposium on On-Line Testing and Robust System Design, IOLTS 2018
EditoresMihalis Maniatakos, Dan Alexandrescu, Dimitris Gizopoulos, Panagiota Papavramidou
EditorialInstitute of Electrical and Electronics Engineers Inc.
Páginas147-150
Número de páginas4
ISBN (versión digital)9781538659922
DOI
EstadoPublicada - 26 sep. 2018
Publicado de forma externa
Evento24th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2018 - Platja D'Aro, Espana
Duración: 2 jul. 20184 jul. 2018

Serie de la publicación

Nombre2018 IEEE 24th International Symposium on On-Line Testing and Robust System Design, IOLTS 2018

Conferencia

Conferencia24th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2018
País/TerritorioEspana
CiudadPlatja D'Aro
Período2/07/184/07/18

Nota bibliográfica

Publisher Copyright:
© 2018 IEEE.

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