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Compact and effective representations for sketch-based image retrieval

  • Pablo Torres
  • , Jose M. Saavedra

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

14 Citas (Scopus)

Resumen

Sketch-based image retrieval (SBIR) has undergone an increasing interest in the community of computer vision bringing high impact in real applications. For instance, SBIR brings an increased benefit to eCommerce search engines because it allows users to formulate a query just by drawing what they need to buy. However, current methods showing high precision in retrieval work in a high dimensional space, which negatively affects aspects like memory consumption and time processing. Although some authors have also proposed compact representations, these drastically degrade the performance in a low dimension. Therefore in this work, we present different results of evaluating methods for producing compact embeddings in the context of sketch-based image retrieval. Our main interest is in strategies aiming to keep the local structure of the original space. The recent unsupervised local-topology preserving dimension reduction method UMAP fits our requirements and shows outstanding performance, improving even the precision achieved by SOTA methods. We evaluate six methods in two different datasets. We use Flickr15K and eCommerce datasets; the latter is another contribution of this work. We show that UMAP allows us to have feature vectors of 16 bytes improving precision by more than 35%.

Idioma originalInglés
Título de la publicación alojadaProceedings - 2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2021
EditorialIEEE Computer Society
Páginas2115-2123
Número de páginas9
ISBN (versión digital)9781665448994
DOI
EstadoPublicada - jun. 2021
Publicado de forma externa
Evento2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2021 - Virtual, Online, Estados Unidos
Duración: 19 jun. 202125 jun. 2021

Serie de la publicación

NombreIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
ISSN (versión impresa)2160-7508
ISSN (versión digital)2160-7516

Conferencia o congreso

Conferencia o congreso2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2021
País/TerritorioEstados Unidos
CiudadVirtual, Online
Período19/06/2125/06/21

Nota bibliográfica

Publisher Copyright:
© 2021 IEEE.

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