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BEOL-Compatible Superlattice FEFET Analog Synapse with Improved Linearity and Symmetry of Weight Update

  • Khandker Akif Aabrar*
  • , Sharadindu Gopal Kirtania
  • , Fu Xiang Liang
  • , Jorge Gomez
  • , Matthew San Jose
  • , Yandong Luo
  • , Huacheng Ye
  • , Sourav Dutta
  • , Priyankka G. Ravikumar
  • , Prasanna Venkatesan Ravindran
  • , Asif Islam Khan
  • , Shimeng Yu
  • , Suman Datta
  • *Autor correspondiente de este trabajo

Producción científica: Contribución a una revistaArtículorevisión exhaustiva

56 Citas (Scopus)

Resumen

Pseudo-crossbar arrays using ferroelectric field effect transistor (FEFET) mitigates weight movement and allows in situ vector-matrix multiplication (VMM), which can significantly accelerate online training of deep neural networks (DNNs). However, the training accuracy of DNNs using conventional FEFETs is low because of the non-idealities, such as nonlinearity, asymmetry, limited bit precision, and limited dynamic range of the weight updates. The limited endurance of these devices degrades the training accuracy further. Here, we show a novel approach for designing the gate-stack of an FEFET analog synapse using a superlattice (SL) of ferroelectric (FE)/dielectric (DE)/FE. The partial polarization states are stabilized by harnessing the depolarization field from the DE spacer, which mitigates the weight update non-idealities. We demonstrate a 7-bit SL-FEFET analog synapse with improved weight update profile, resulting in 94.1% online training accuracy for MNIST handwritten digit classification task. The device uses an indium-tungsten-oxide (IWO) channel and back-end-of line (BEOL)-compatible process flow. The absence of low-k interlayer (IL) results in high endurance (>1010 cycles), while the BEOL compatibility paves the way to high-density integration of pseudo-crossbar arrays and flexibility for neuromorphic circuit design.

Idioma originalInglés
Páginas (desde-hasta)2094-2100
Número de páginas7
PublicaciónIEEE Transactions on Electron Devices
Volumen69
N.º4
DOI
EstadoPublicada - 1 abr. 2022
Publicado de forma externa

Nota bibliográfica

Publisher Copyright:
© 2021 IEEE.

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