Abstract
Sketch-based understanding is a critical component of human cognitive learning and is a primitive communication means between humans. This topic has recently attracted the interest of the computer vision community as sketching represents a powerful tool to express static objects and dynamic scenes. Unfortunately, despite its broad application domains, the current sketch-based models strongly rely on labels for supervised training, ignoring knowledge from unlabeled data, thus limiting the underlying generalization and the applicability. Therefore, we present a study about the use of unlabeled data to improve a sketch-based model. To this end, we evaluate variations of VAE and semi-supervised VAE, and present an extension of BYOL to deal with sketches. Our results show the superiority of sketch-BYOL, which outperforms other self-supervised approaches increasing the retrieval performance for known and unknown categories. Furthermore, we show how other tasks can benefit from our proposal.
| Original language | English |
|---|---|
| Pages (from-to) | 5149-5158 |
| Number of pages | 10 |
| Journal | IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops |
| DOIs | |
| State | Published - 2022 |
| Event | 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022 - New Orleans, United States Duration: 19 Jun 2022 → 20 Jun 2022 |
Bibliographical note
Publisher Copyright:© 2022 IEEE.