Leveraging Unlabeled Data for Sketch-based Understanding

Javier Morales*, Nils Murrugarra-Llerena*, Jose M. Saavedra*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

Sketch-based understanding is a critical component of human cognitive learning and is a primitive communication means between humans. This topic has recently attracted the interest of the computer vision community as sketching represents a powerful tool to express static objects and dynamic scenes. Unfortunately, despite its broad application domains, the current sketch-based models strongly rely on labels for supervised training, ignoring knowledge from unlabeled data, thus limiting the underlying generalization and the applicability. Therefore, we present a study about the use of unlabeled data to improve a sketch-based model. To this end, we evaluate variations of VAE and semi-supervised VAE, and present an extension of BYOL to deal with sketches. Our results show the superiority of sketch-BYOL, which outperforms other self-supervised approaches increasing the retrieval performance for known and unknown categories. Furthermore, we show how other tasks can benefit from our proposal.

Original languageEnglish
Title of host publicationProceedings - 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022
PublisherIEEE Computer Society
Pages5149-5158
Number of pages10
ISBN (Electronic)9781665487399
DOIs
StatePublished - 2022
Event2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022 - New Orleans, United States
Duration: 19 Jun 202220 Jun 2022

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
Volume2022-June
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022
Country/TerritoryUnited States
CityNew Orleans
Period19/06/2220/06/22

Bibliographical note

Publisher Copyright:
© 2022 IEEE.

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