Abstract
Sketch-based understanding is a critical component of human cognitive learning and is a primitive communication means between humans. This topic has recently attracted the interest of the computer vision community as sketching represents a powerful tool to express static objects and dynamic scenes. Unfortunately, despite its broad application domains, the current sketch-based models strongly rely on labels for supervised training, ignoring knowledge from unlabeled data, thus limiting the underlying generalization and the applicability. Therefore, we present a study about the use of unlabeled data to improve a sketch-based model. To this end, we evaluate variations of VAE and semi-supervised VAE, and present an extension of BYOL to deal with sketches. Our results show the superiority of sketch-BYOL, which outperforms other self-supervised approaches increasing the retrieval performance for known and unknown categories. Furthermore, we show how other tasks can benefit from our proposal.
Original language | English |
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Title of host publication | Proceedings - 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022 |
Publisher | IEEE Computer Society |
Pages | 5149-5158 |
Number of pages | 10 |
ISBN (Electronic) | 9781665487399 |
DOIs | |
State | Published - 2022 |
Event | 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022 - New Orleans, United States Duration: 19 Jun 2022 → 20 Jun 2022 |
Publication series
Name | IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops |
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Volume | 2022-June |
ISSN (Print) | 2160-7508 |
ISSN (Electronic) | 2160-7516 |
Conference
Conference | 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022 |
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Country/Territory | United States |
City | New Orleans |
Period | 19/06/22 → 20/06/22 |
Bibliographical note
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