Experimental measurements on resistive switching devices: Gaining hands-on experience

Jorge Gomez, Angel Abusleme, Ioannis Vourkas, Georgios Ch Sirakoulis

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

The maximum exploitation of the favorable properties and the analog nature of memristor technology in innovative applications can be guaranteed only by the deeper understanding of their behavior. Fully functional memristors are commercially available. However, lab experiments with memristors are a challenging step. In this direction, this paper presents some important considerations to carry out reliable measurements. Most importantly, the proposed experimental setup is composed of off-the-shelf components and an affordable data acquisition system, showing the way on how to bypass the need for expensive research equipment and expand memristor experimentation beyond research labs and into classrooms.

Original languageEnglish
Title of host publication2018 7th International Conference on Modern Circuits and Systems Technologies, MOCAST 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-4
Number of pages4
ISBN (Electronic)9781538647882
DOIs
StatePublished - 8 Jun 2018
Externally publishedYes
Event7th International Conference on Modern Circuits and Systems Technologies, MOCAST 2018 - Thessaloniki, Greece
Duration: 7 May 20189 May 2018

Publication series

Name2018 7th International Conference on Modern Circuits and Systems Technologies, MOCAST 2018

Conference

Conference7th International Conference on Modern Circuits and Systems Technologies, MOCAST 2018
Country/TerritoryGreece
CityThessaloniki
Period7/05/189/05/18

Bibliographical note

Publisher Copyright:
© 2018 IEEE.

Keywords

  • device characterization
  • memristor
  • ReRAM
  • resistive switching
  • teaching memristor
  • transimpedance amplifier

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