Abstract
Sketch-based image retrieval (SBIR) has undergone an increasing interest in the community of computer vision bringing high impact in real applications. For instance, SBIR brings an increased benefit to eCommerce search engines because it allows users to formulate a query just by drawing what they need to buy. However, current methods showing high precision in retrieval work in a high dimensional space, which negatively affects aspects like memory consumption and time processing. Although some authors have also proposed compact representations, these drastically degrade the performance in a low dimension. Therefore in this work, we present different results of evaluating methods for producing compact embeddings in the context of sketch-based image retrieval. Our main interest is in strategies aiming to keep the local structure of the original space. The recent unsupervised local-topology preserving dimension reduction method UMAP fits our requirements and shows outstanding performance, improving even the precision achieved by SOTA methods. We evaluate six methods in two different datasets. We use Flickr15K and eCommerce datasets; the latter is another contribution of this work. We show that UMAP allows us to have feature vectors of 16 bytes improving precision by more than 35%.
Original language | English |
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Title of host publication | Proceedings - 2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2021 |
Publisher | IEEE Computer Society |
Pages | 2115-2123 |
Number of pages | 9 |
ISBN (Electronic) | 9781665448994 |
DOIs | |
State | Published - Jun 2021 |
Externally published | Yes |
Event | 2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2021 - Virtual, Online, United States Duration: 19 Jun 2021 → 25 Jun 2021 |
Publication series
Name | IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops |
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ISSN (Print) | 2160-7508 |
ISSN (Electronic) | 2160-7516 |
Conference
Conference | 2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2021 |
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Country/Territory | United States |
City | Virtual, Online |
Period | 19/06/21 → 25/06/21 |
Bibliographical note
Publisher Copyright:© 2021 IEEE.