Compact and effective representations for sketch-based image retrieval

Pablo Torres, Jose M. Saavedra

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

10 Scopus citations

Abstract

Sketch-based image retrieval (SBIR) has undergone an increasing interest in the community of computer vision bringing high impact in real applications. For instance, SBIR brings an increased benefit to eCommerce search engines because it allows users to formulate a query just by drawing what they need to buy. However, current methods showing high precision in retrieval work in a high dimensional space, which negatively affects aspects like memory consumption and time processing. Although some authors have also proposed compact representations, these drastically degrade the performance in a low dimension. Therefore in this work, we present different results of evaluating methods for producing compact embeddings in the context of sketch-based image retrieval. Our main interest is in strategies aiming to keep the local structure of the original space. The recent unsupervised local-topology preserving dimension reduction method UMAP fits our requirements and shows outstanding performance, improving even the precision achieved by SOTA methods. We evaluate six methods in two different datasets. We use Flickr15K and eCommerce datasets; the latter is another contribution of this work. We show that UMAP allows us to have feature vectors of 16 bytes improving precision by more than 35%.

Original languageEnglish
Title of host publicationProceedings - 2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2021
PublisherIEEE Computer Society
Pages2115-2123
Number of pages9
ISBN (Electronic)9781665448994
DOIs
StatePublished - Jun 2021
Externally publishedYes
Event2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2021 - Virtual, Online, United States
Duration: 19 Jun 202125 Jun 2021

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2021
Country/TerritoryUnited States
CityVirtual, Online
Period19/06/2125/06/21

Bibliographical note

Publisher Copyright:
© 2021 IEEE.

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