Abstract
Off-chip DRAM memory accesses limit the energy efficiency and training time of state-of-The-Art deep neural networks (DNN). Compute-in-memory (CIM) accelerators leveraging pseudo-crossbar arrays and on-chip weight storage have emerged as alternatives to GPUs for fast and efficient training. However, this comes at the cost of reduced training accuracy due to weight cell non-idealities such as: low bit precision, nonlinearity, asymmetry, low Gmax/Gmin ratio, and slow programming speed. Here, we engineer the ferroelectric domain structure in a carefully designed superlattice (SL) ferroelectric(FE)/dielectric(DE) stack, to experimentally demonstrate high precision FEFET analog weight cells with excellent linearity and symmetry during potentiation and depression. We demonstrate switching speed as low as 100 ns in the SL-based ferroelectric capacitor (FECAP), with no degradation in either retention or endurance. We integrate the SL FE/DE/FE with a back-end-of-line (BEOL) compatible Indium Tungsten Oxide transistors, to demonstrate 128 stable conductance states with improved linearity and symmetry. System-level analysis of SL-FEFET based CIM accelerators show an excellent 94.1% online learning accuracy without degrading any other performance parameter, with potential for monolithic 3D integration.
Original language | English |
---|---|
Title of host publication | 2021 IEEE International Electron Devices Meeting, IEDM 2021 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 19.6.1-19.6.4 |
ISBN (Electronic) | 9781665425728 |
DOIs | |
State | Published - 2021 |
Externally published | Yes |
Event | 2021 IEEE International Electron Devices Meeting, IEDM 2021 - San Francisco, United States Duration: 11 Dec 2021 → 16 Dec 2021 |
Publication series
Name | Technical Digest - International Electron Devices Meeting, IEDM |
---|---|
Volume | 2021-December |
ISSN (Print) | 0163-1918 |
Conference
Conference | 2021 IEEE International Electron Devices Meeting, IEDM 2021 |
---|---|
Country/Territory | United States |
City | San Francisco |
Period | 11/12/21 → 16/12/21 |
Bibliographical note
Publisher Copyright:© 2021 IEEE.